Terahertz-dependent identification of simulated hole shapes in oil–gas reservoirs
Bao Ri-Ma1, 2, †, , Zhan Hong-Lei1, 2, †, , Miao Xin-Yang2, Zhao Kun1, 2, 3, ‡, , Feng Cheng-Jing2, Dong Chen2, Li Yi-Zhang2, Xiao Li-Zhi1
       

Microscope images of the three hole shapes punched on the Si wafers.