Growth condition optimization and mobility enhancement through inserting AlAs monolayer in the InP-based InxGa1−xAs/In0.52Al0.48As HEMT structures
Zhou Shu-Xing, Qi Ming†, , Ai Li-Kun, Xu An-Huai
       

Numerical simulation of the band diagram, donor concentration, and 2DEG density in the region around the 2DEG for the HEMT structure of sample D with the inserted AlAs monolayer at the InAlAs/InGaAs interface and the InAlAs spacer layer.