Ding Lili 1, 2, 3, †, ![](http://cpb.iphy.ac.cn/html_resources/images/REemail.gif) , Gerardin Simone 2, 3, Bagatin Marta 2, Bisello Dario 2, Mattiazzo Serena 2, Paccagnella Alessandro 2, 3
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(a) Comparison of the proton-induced ΔION/ION,pre value and the modified x-ray-induced ΔION/ION,pre curve for the 600/60 nm core pMOSFET; (b) comparison of ΔION/ION,pre induced by the two sources for two I/O pMOSFETs. |