Pattern dependence in synergistic effects of total dose on single-event upset hardness
Guo Hongxia†, , Ding Lili, Xiao Yao, Zhang Fengqi, Luo Yinhong, Zhao Wen, Wang Yuanming
       

Evolution of Q and Q′ voltages when N2 (a) or P1 (b) were struck in SEU test. The pattern combination during irradiation was Q = 0/Q = 1.