Pattern dependence in synergistic effects of total dose on single-event upset hardness
Guo Hongxia†, 
, Ding Lili, Xiao Yao, Zhang Fengqi, Luo Yinhong, Zhao Wen, Wang Yuanming
, Ding Lili, Xiao Yao, Zhang Fengqi, Luo Yinhong, Zhao Wen, Wang Yuanming Schematic of performing mixed-mode simulation in the SRAM cell.
