Experimentally measured response of the TMA, and LC simulations. (a) Reflection spectroscopy from 1–7 V. The magnitude of the reflection changes by about 10 dB at the resonant frequency of 0.84 THz. (b), (c) Schematic of simulated LC director evolution with the driving voltages of panel (a), only the LC on the metal wire disk re-orients its director. (d) Reflection spectroscopy from 10–25 V. The resonant frequency shifts downward from 0.838 THz to 0.828 THz. (e), (f) Schematic of simulated LC director evolution with the driving voltages of panel (d), the LC re-orients its director gradually along the radial and azimuth directions with increasing voltage. (g) Tunable reflection spectroscopy from 30–60 V. The magnitude of the reflection changes by over 10 dB at 0.825 THz. (h), (i) The corresponding LC director distribution of panel (g), all the LC directors are nearly vertical at 60 V.