Microtrap on a concave grating reflector for atom trapping
Zhang Hui1, Li Tao2, Yin Ya-Ling1, Li Xing-Jia1, Xia Yong1, †, , Yin Jian-Ping1
(a) and (b) 2D intensity distributions of the focused beam on the xy and yz planes respectively, when plane wave illuminates from the curved Si-grating side. The wavelength of the incident light is 1.55 μm. (c) and (d) 1D relative intensity distributions on the x and y axis at the focusing point for panels (a) and (b) respectively.