AlOx/LiF composite protection layer for Cr-doped (Bi,Sb)2Te3 quantum anomalous Hall films
Ou Yunbo1, Feng Yang2, Feng Xiao1, 2, Hao Zhenqi2, Zhang Liguo2, Liu Chang2, Wang Yayu2, †, , He Ke2, ‡, , Ma Xucun2, Xue Qikun2
       

(a)–(c) The RHEED pattern (top panels) and 1 μm × 1 μm AFM images (bottom panels) of (a) bare, (b) 5-nm LiF capped, and (c) 40-nm LiF capped 5 QL Cr0.15(Bi0.1Sb0.9)1.85Te3 film. The yellow curves in the AFM images are the line profiles of the AFM images indicated by the green dash lines.