Effect of cryogenic temperature characteristics on 0.18-μm silicon-on-insulator devices
Xie Bingqing
, Li Bo
, Bi Jinshun
, Bu Jianhui
, Wu Chi
, Li Binhong
, Han Zhengsheng
, Luo Jiajun
†,
Drifting of
C
GB
curve (NMOSFET) in cryogenic temperature.