Effect of cryogenic temperature characteristics on 0.18-μm silicon-on-insulator devices
Xie Bingqing, Li Bo, Bi Jinshun, Bu Jianhui, Wu Chi, Li Binhong, Han Zhengsheng, Luo Jiajun†, 
Structure of H-gate.
Effect of cryogenic temperature characteristics on 0.18-μm silicon-on-insulator devices |
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Xie Bingqing, Li Bo, Bi Jinshun, Bu Jianhui, Wu Chi, Li Binhong, Han Zhengsheng, Luo Jiajun†,
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Structure of H-gate. |
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