Modeling random telegraph signal noise in CMOS image sensor under low light based on binomial distribution
Zhang Yu1, 2, †, 
, Lu Xinmiao2, Wang Guangyi1, 2, Hu Yongcai2, Xu Jiangtao3
, Lu Xinmiao2, Wang Guangyi1, 2, Hu Yongcai2, Xu Jiangtao3 The state transition of the electron/hole captured by the trap energy level in the unit time.
