Modeling random telegraph signal noise in CMOS image sensor under low light based on binomial distribution
Zhang Yu1, 2, †, 
, Lu Xinmiao2, Wang Guangyi1, 2, Hu Yongcai2, Xu Jiangtao3
, Lu Xinmiao2, Wang Guangyi1, 2, Hu Yongcai2, Xu Jiangtao3 The electrical characteristics caused by the single trap.
