Modulation of physical properties of oxide thin films by multiple fields

Yang Hua-Li^{1, 2}, Wang Bao-Min^{1, 2, †,}, Zhu Xiao-Jian^{1, 2}, Shang Jie^{1, 2}, Chen Bin^{1, 2}, Li Run-Wei^{1, 2, ‡,}

(a) Temperature dependence of resistivity of 8-nm LSMO thin films on different substrates under zero magnetic field. (b) Schematic diagram of the experimental set-up used to measure the in-plane resistivity of the LSMO thin films along the two orthogonal directions (x and y). (c) Resistivity versus temperature curves for 9.6-nm LSMO on DSO along the two channels during cooling and heating processes. (d) The in-plane resistivity anisotropy, (ρ_b–ρ_a)/ρ_a, of 8-nm LSMO thin films on different substrates. (e) The resistivity versus temperature curves under different magnetic fields for 9.6-nm LSMO films on DSO.^[158]