Aberration-corrected scanning transmission electron microscopy for complex transition metal oxides
Zhang Qing-Hua1, Xiao Dong-Dong2, Gu Lin2, 3, †,
       

Octahedral and tetrahedral EELS maps generated by fitting the average components to the atomic resolution data (a), the octahedral component (b) and tetrahedral component (c) peak at the corresponding Fe/Co intermixed layers, as clearly evidenced by the intensity profiles over the full image width. Reproduced from Ref. [37].