Aberration-corrected scanning transmission electron microscopy for complex transition metal oxides

Zhang Qing-Hua¹, Xiao Dong-Dong², Gu Lin^{2, 3, †,}

Schematic diagram of the common imaging and spectrum modes in an STEM, composed of annular dark-field (ADF) or high-angle annular dark-field (HAADF) images(depending on the inner angle β₁), bright-field (BF) or angular bright-field (ABF) image (depending on the inner angle α₀), electron energy-loss spectroscopy (EELS) and x-ray energy dispersive spectroscopy (EDX).