Damage effect and mechanism of the GaAs pseudomorphic high electron mobility transistor induced by the electromagnetic pulse
Xi Xiao-Wen1, †, 
, Chai Chang-Chun1, Zhao Gang2, Yang Yin-Tang1, Yu Xin-Hai1, Liu Yang1
, Chai Chang-Chun1, Zhao Gang2, Yang Yin-Tang1, Yu Xin-Hai1, Liu Yang1 Distribution of the temperature (K) at the burnout time.
