Field emission properties of a-C and a-C:H films deposited on silicon surfaces modified with nickel nanoparticles
Jiang Jin-Long
1, †,
, Wang Yu-Bao
1
, Wang Qiong
1
, Huang Hao
1
, Wei Zhi-Qiang
1
, Hao Jun-Ying
2
RMS surface roughness values of the deposited films.