An analytical model for nanowire junctionless SOI FinFETs with considering three-dimensional coupling effect
Liu Fan-Yu1, †, , Liu Heng-Zhu1, Liu Bi-Wei1, Guo Yu-Feng2
       

Potential profiles in the full depletion region along x = 0 (see Fig. 1(b)) each as a function of front gate voltage for (a) wide JL SOI FinFET (Wfin = 100 nm) and (b) a narrow JL SOI FinFET (Wfin = 9 nm). ND = 1019 cm−3, Tsi = 9 nm, VD = 0.05 V, and VBG = 0 V. y = −Tsi/2 is at the top of the film and y = Tsi/2 is at the BOX interface.