Study on electrical defects level in single layer two-dimensional Ta<sub>2</sub>O<sub>5</sub>

Study on electrical defects level in single layer two-dimensional Ta₂O₅

Li Dahai¹, Song Xiongfei², Hu Linfeng³, Wang Ziyi¹, Zhang Rongjun^{1, †,}, Chen Liangyao¹, Zhang David Wei², Zhou Peng^{2, ‡,}

Experimental and modeled values for the ellipsometric parameters Ψ and Δ for different samples dipped for 20 minutes: (a) sample 1, (b) sample 2, and (c) sample 3, respectively.