Study on electrical defects level in single layer two-dimensional Ta<sub>2</sub>O<sub>5</sub>

Study on electrical defects level in single layer two-dimensional Ta₂O₅

Li Dahai¹, Song Xiongfei², Hu Linfeng³, Wang Ziyi¹, Zhang Rongjun^{1, †,}, Chen Liangyao¹, Zhang David Wei², Zhou Peng^{2, ‡,}

Fabrication of single layer two-dimensional Ta₂O₅ via assemblies of nanosheets, and SE was used to detect their electrical defects levels.