Radiation-induced 1/<italic>f</italic> noise degradation of PNP bipolar junction transistors at different dose rates

Radiation-induced 1/f noise degradation of PNP bipolar junction transistors at different dose rates

Zhao Qi-Feng¹, Zhuang Yi-Qi¹, Bao Jun-Lin^{1, †,}, Hu Wei²

Cross-section of the emitter base junction, illustrating accumulation regions in the presence of positive oxide charge.