Microstructure and lateral conductivity control of hydrogenated nanocrystalline silicon oxide and its application in a-Si:H/a-SiGe:H tandem solar cells
Li Tian-Tian1, 2, 4, 5, Yang Tie1, 3, Fang Jia1, 2, 4, 5, Zhang De-Kun1, 2, 4, 5, Sun Jian1, 2, 4, 5, Wei Chang-Chun1, 2, 4, 5, Xu Sheng-Zhi1, 2, 4, 5, Wang Guang-Cai1, 2, 4, 5, Liu Cai-Chi3, Zhao Ying1, Zhang Xiao-Dan1, 2, 4, 5, †,
       

Raman spectra of the n-nc-SiOx:H films with the laser incidence from ((a), (b), and (c)) the glass side (samples B, F, G) and ((d), (e), and (f)) from film side (samples B, F, G), respectively.