Control of symmetric properties of metamorphic In
0.27
Ga
0.73
As layers by substrate misorientation
Yu Shu-Zhen
1
, Dong Jian-Rong
1, †,
, Sun Yu-Run
1
, Li Kui-Long
1, 2
, Zeng Xu-Lu
1, 2
, Zhao Yong-Ming
1
, Yang Hui
1
PL spectra of In
0.27
Ga
0.73
As layers in 2°-off, 7°-off, and 15°-off samples.