Charge recombination mechanism to explain the negative capacitance in dye-sensitized solar cells
Feng Lie-Feng†, , Zhao Kun, Dai Hai-Tao, Wang Shu-Guo, Sun Xiao-Wei
       

Equivalent for small AC perturbation, which can explain the NC. Rc is the total series resistance generally caused by constant resistance of the cell; Rr is the recombination resistance including Rrac and Rrdc, and Cr is the recombination capacitance relate the electron transport process in film; Cμ is the chemical capacitance that stands for the change of electron density as a function of the Fermi level; Rct is a charge-transfer resistance related to the traditional recombination of free carriers at electrolyte interface.