Theoretical analysis of the influence of flexoelectric effect on the defect site in nematic inversion walls
Zheng Gui-Li1, 2, 3, †, , Zhang Hui3, Ye Wen-Jiang3, Zhang Zhi-Dong3, ‡, , Song Hong-Wei4, Xuan Li1
       

The director profile in the mid-plane z = d/2 for −1 defect without applied voltage.