High-pressure structural properties of tetramethylsilane
Qin Zhen-Xing1, 2, Chen Xiao-Jia3, †,
       

Synchrotron radiation x-ray (λ = 0.3989 Å) diffraction patterns of TMS during the pressurization from ambient pressure to 31.1 GPa. Red asterisks marked indicate the signals from the gasket material tungsten. The intensity of first peak is reduced to 1/5 at 4.2 GPa due to strong preferred orientation of (211) in Pnma phase.