Numerical simulation of modulation to incident laser by submicron to micron surface contaminants on fused silica
Yang Liang1, 2, Xiang Xia1, †, , Miao Xin-Xiang2, ‡, , Li Li1, Yuan Xiao-Dong2, Yan Zhong-Hua1, Zhou Guo-Rui2, Lv Hai-Bing2, Zheng Wan-Guo2, Zu Xiao-Tao1
       

Electric field ∣E∣ distribution inxyplane (z= 53δ) andEmaxalongxdirection for one (a), two (b), and four (c) particles. Left: model, middle:Einxyplane (z= 53δ), right:Emaxalongxdirection.