Numerical simulation of modulation to incident laser by submicron to micron surface contaminants on fused silica

Yang Liang^{1, 2}, Xiang Xia^{1, †,}, Miao Xin-Xiang^{2, ‡,}, Li Li¹, Yuan Xiao-Dong², Yan Zhong-Hua¹, Zhou Guo-Rui², Lv Hai-Bing², Zheng Wan-Guo², Zu Xiao-Tao¹

Electric field ∣E∣ distribution inx–yplane (z= 53δ) andE_maxalongxdirection for one (a), two (b), and four (c) particles. Left: model, middle:Einx–yplane (z= 53δ), right:E_maxalongxdirection.