Numerical simulation of modulation to incident laser by submicron to micron surface contaminants on fused silica

Yang Liang^{1, 2}, Xiang Xia^{1, †,}, Miao Xin-Xiang^{2, ‡,}, Li Li¹, Yuan Xiao-Dong², Yan Zhong-Hua¹, Zhou Guo-Rui², Lv Hai-Bing², Zheng Wan-Guo², Zu Xiao-Tao¹

Variation ofE_maxwith the relative dielectric constantε_rof particle for the particle on (a) the input surface and (b) the output surface for different flattening of the ellipsoid.