Numerical simulation of modulation to incident laser by submicron to micron surface contaminants on fused silica

Yang Liang^{1, 2}, Xiang Xia^{1, †,}, Miao Xin-Xiang^{2, ‡,}, Li Li¹, Yuan Xiao-Dong², Yan Zhong-Hua¹, Zhou Guo-Rui², Lv Hai-Bing², Zheng Wan-Guo², Zu Xiao-Tao¹

Electric field ∣E∣ distributions inx–zplane and peak electric fieldE_maxalongzdirection for different flattening of ellipsoid: (a)a= 4λ,b=c=λ, (b)a= 4λ,b=c= 2λ, (c)a= 4λ,b=c= 3λ, (d)a=b=c= 4λ, and (e)a= 4λ,b=c= 5λfor contaminant on the input surface. Left:Einx–zplane (y= 89δ), right:E_maxalongzdirection.