Numerical simulation of modulation to incident laser by submicron to micron surface contaminants on fused silica
Yang Liang1, 2, Xiang Xia1, †, 
, Miao Xin-Xiang2, ‡, , Li Li1, Yuan Xiao-Dong2, Yan Zhong-Hua1, Zhou Guo-Rui2, Lv Hai-Bing2, Zheng Wan-Guo2, Zu Xiao-Tao1
, Miao Xin-Xiang2, ‡, , Li Li1, Yuan Xiao-Dong2, Yan Zhong-Hua1, Zhou Guo-Rui2, Lv Hai-Bing2, Zheng Wan-Guo2, Zu Xiao-Tao1 The morphology of the particulate contaminant observed by (a) optical microscope and (b) scanning electron microscopy.
