Recovery of PMOSFET NBTI under different conditions

Cao Yan-Rong†^a),^b), Yang Yi^a), Cao Cheng^a), He Wen-Long^a), Zheng Xue-Feng^b), Ma Xiao-Hua^c), Hao Yue^b)

Two cycles of NBTI degradation stages: (a) the device threshold voltage shifts and (b) the normalized threshold voltage shifts.