Cubic ZnO films obtained at low pressure by molecular beam epitaxy*
Wang Xiao-Dan, Zhou Hua, Wang Hui-Qiong†, Ren Fei, Chen Xiao-Hang, Zhan Hua-Han, Zhou Ying-Hui, Kang Jun-Yong
       
The diffraction intensity profiles from the horizontal direction of the RHEED patterns (using the top three spots) in (a) Fig.  1(c) and (b) Fig.  1(e) .