Effects of back gate bias on radio-frequency performance in partially depleted silicon-on-inslator nMOSFETs
Lü Kai, Jing Chen†, Luo Jie-Xin, He Wei-Wei, Huang Jian-Qiang, Chai Zhan, Wang Xi
       
(a) Top view of FB, (b) top view of TB devices, and (c) cross-section view of TDBC.