Irradiation effects of graphene and thin layer graphite induced by swift heavy ions

Zeng Jian^a), Liu Jie†^a), Zhang Sheng-Xia^a),^b), Zhai Peng-Fei^a), Yao Hui-Jun^a), Duan Jing-Lai^a), Guo Hang^a),^b), Hou Ming-Dong^a), Sun You-Mei^a)

AFM image acquired on a 45 μm×45 μm scan area on graphene and different thickness graphite films deposited on SiO₂/Si. The number marks 1 and 3 are corresponding to the marks with the same number of optical microscopy image of HOPG fragments.