Characterizing silicon intercalated graphene grown epitaxially on Ir films by atomic force microscopy
Zhang Yonga) , Wang Ye-Liang†a), b) 
, Que Yan-Dea) , Gao Hong-Juna), b)
, Que Yan-De
Characterizing silicon intercalated graphene grown epitaxially on Ir films by atomic force microscopy |
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Zhang Yong
, Que Yan-De |
| Friction force microscopy (FFM) characterization of Si intercalated graphene on Ir thin film. (a) Friction-force mapping with a forward scanning direction of the sample. The lower friction region (in brown) is assigned to graphene and the higher friction region (in yellow) is SiO x . This image was acquired in contact mode with a scanning rate of 1 Hz. (b) The corresponding friction signals of the trace and retrace processes taken along the white dashed line in panel (a). |
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