Theoretical analysis of semi/non-polar InGaN/GaN light-emitting diodes grown on silicon substrates
Yu Leia), Zhang Yuan-Wena), Li Kaia), Pi Huia), Diao Jia-Shenga), Wang Xing-Fua), Hu Wen-Xiaoa), Zhang Chong-Zhena), Song Wei-Donga), Shen Yuea), Li Shu-Ti†a),b)
       
The distribution of electron concentration (a), hole concentration (b), radiative recombination rate (c), and polarization electrostatic field (d) of InGaN/GaN MQWs at 180 mA injection current for polar (A), semi-polar (B), and non-polar (C) structure InGaN/GaN LEDs.