Energy distribution extraction of negative charges responsible for positive bias temperature instability*
Ren Shang-Qing†, Yang Hong, Wang Wen-Wu‡, Tang Bo, Tang Zhao-Yun, Wang Xiao-Lei, Xu Hao, Luo Wei-Chun, Zhao Chao, Yan Jiang, Chen Da-Peng, Ye Tian-Chun
       
Measurement setup. The stress voltage was interrupted for the measurement of I d– V g to extract V th at the black points.