New method for fast morphological characterization of organic polycrystalline films by polarized optical microscopy
He Xiao-Chuana) , Yang Jian-Bingb) , Yan Dong-Hangb) , Weng Yu-Xiang†a) 
New method for fast morphological characterization of organic polycrystalline films by polarized optical microscopy |
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He Xiao-Chuan
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| (a) Isotropic component image drawn from fitted values of A . (b) Relative crystallinity image drawn from fitted values of B . (c) Relative orientation image drawn from fitted values of β . (d) AFM images (5×5 μm2 each) of the sub-regions of the 22×22 μm2 region indicated by the hollow squares in panels (a)–(c). |
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