New method for fast morphological characterization of organic polycrystalline films by polarized optical microscopy*
He Xiao-Chuana), Yang Jian-Bingb), Yan Dong-Hangb), Weng Yu-Xiang†a)
       
Transmittance images of a 50×50 μm2 region under non-polarized light (a), and polarized light of 0° (b), 60° (c), and 120° (d).