New method for fast morphological characterization of organic polycrystalline films by polarized optical microscopy*
He Xiao-Chuana), Yang Jian-Bingb), Yan Dong-Hangb), Weng Yu-Xiang†a)
       
(a) Schematic of the optical path of the POM measurement. (b) A full scale (222×222 μm) transmittance image under polarized light (see text for detail). (c) Demonstration of the light absorption through coupling between a transition dipole and an electrical field.