Theoretical investigation of sulfur defects on structural, electronic, and elastic properties of ZnSe semiconductor
Zafar Muhammad†a), Ahmed Shabbira), Shakil M.a), Choudhary M. A.a), Mahmood K.b)
       
Total and partial DOSs of ZnSe1− x S x at x = 0.00 (a), 0.25 (b), 0.50 (c), 0.75 (d), and 1.00 (e), each as a function of sulfur composition.