Modeling the reactive sputter deposition of Ti-doped VO x thin films*
Wang Taoa), Yu Hea)†, Gu De-Ena), Guo Ruia), Dong Xianga), Jiang Ya-Donga), Wu Rui-Linb)
       
(a) Calculated and (b) measured target voltages versus oxygen flow rate for vanadium targets with Ti inserts and single vanadium target.