Characterization of CoPt nanowire fabricated by glancing angle deposition

Satoshi Kitai^a),^b)†, Zhang Zheng-Jun^a), Shi Ji^b), Yoshio Nakamura^b)

Angular dependence of M _r/ M _s. (a) Series 1, (b) Series 2, (c) Pure Co. (d) Schematic of measuring direction.