Characterization of CoPt nanowire fabricated by glancing angle deposition

Satoshi Kitai^a),^b)†, Zhang Zheng-Jun^a), Shi Ji^b), Yoshio Nakamura^b)

XRD profiles of the samples. (a) Series 1, (b) Series 2, (c) annealed samples of Series 2, (d) a conventional film, and (e) the pure Co nanowire.