Transient simulation and analysis of current collapse due to trapping effects in AlGaN/GaN high-electron-mobility transistor<xref ref-type="fn" rid="cpb142178fn1">*</xref>

Transient simulation and analysis of current collapse due to trapping effects in AlGaN/GaN high-electron-mobility transistor*

Zhou Xing-Ye†, Feng Zhi-Hong‡, Wang Yuan-Gang, Gu Guo-Dong, Song Xu-Bo, Cai Shu-Jun

Simulated turn-on pulse gate-lag transient current responses of Al_0.3Ga_0.7N/GaN HEMT with/without (w/o) the thermal effect.