Comparative research on “high currents” induced by single event latch-up and transient-induced latch-up
*
Chen Rui
a),
b)†
, Han Jian-Wei
a)
, Zheng Han-Sheng
a),
b)
, Yu Yong-Tao
a),
b)
, Shangguang Shi-Peng
a)
, Feng Guo-Qiang
a)
, Ma Ying-Qi
a)
Changes of SEL (a) and TLU (b) current of the test device with external stimulus.