Comparative research on “high currents” induced by single event latch-up and transient-induced latch-up*
Chen Ruia),b)†, Han Jian-Weia), Zheng Han-Shenga),b), Yu Yong-Taoa),b), Shangguang Shi-Penga), Feng Guo-Qianga), Ma Ying-Qia)
       
The 1000 times enlarged photographs of the sensitive areas of region 1 (a), region 2 (b), region 3 (c), and region 4 (d).