Comparative research on “high currents” induced by single event latch-up and transient-induced latch-up
*
Chen Rui
a),
b)†
, Han Jian-Wei
a)
, Zheng Han-Sheng
a),
b)
, Yu Yong-Tao
a),
b)
, Shangguang Shi-Peng
a)
, Feng Guo-Qiang
a)
, Ma Ying-Qi
a)
The 1000 times enlarged photographs of the sensitive areas of region 1 (a), region 2 (b), region 3 (c), and region 4 (d).