Comparative research on “high currents” induced by single event latch-up and transient-induced latch-up*
Chen Ruia),b)†, Han Jian-Weia), Zheng Han-Shenga),b), Yu Yong-Taoa),b), Shangguang Shi-Penga), Feng Guo-Qianga), Ma Ying-Qia)
       
Schematic diagram of ESD test system.