Stability and performance analysis of a jump linear control system subject to digital upsets*
Wang Ruia),b)†, Sun Huib), Ma Zhen-Yanga)
       
Theoretical estimations of p zv versus the number of RMUs under the electromagnetic environment of 133.35-MHz frequency and 210-V/m field strength, with each of all the processing units having an upset probability of 0.0026.