Modeling and experiments of N-doped vanadium oxide prepared by a reactive sputtering process
Wang Taoa), Yu Hea)†, Dong Xianga), Jiang Ya-Donga), Wu Rui-Linb)
       
XPS spectra for N1s core levels for film deposited at O2 flow rates of (a) 3.0 sccm, (b) 3.2 sccm, (c) 3.4 sccm, (d) 3.8 sccm, and (e) 5.0 sccm.